DIELECTRIC AND MATERIAL PROPERTY
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Low Permeability testing of RF Connectors, cables, for Low PIM applications per ASTM A342/A342M
ESS has test cavities at 3.5, 5.5, 10, 18, 29 and 37 GHz, for a wide range of material properties covering much of the microwave spectrum.
MEASURING DIELECTRIC PROPERTIES OF LOSSY AND LOW LOSS MATERIALS
Using our High Q cavities, we can measure complex permittivity and permeability on most microwave dielectrics. These tests are performed per ASTM-2520. The photos below show our 3.0 GHz. and a 10.0 GHz. cavities although we have dielectric material measurement cavity fixtures at other frequencies as well.
Testing frequencies for Material Measurements now include 5G Mobile data in the 25 -38 GHz range.
Other photos, on this page show other methods that we use here to determine material properties. Depending on the frequency and material properties, S11, S21 and even capacitive coupling techniques are used to calculate the effective dielectric and magnetic properties of a wide variety of materials. The photo on the right is a WR-90 NRL Arch measurement setup for
At ESS, we have many methods of testing materials for dielectric properties using S11, S21, and cavities
in stripline, waveguide and coaxial fixtures. We can accommodate most any customer supplied geometry or material. Contact ESS for the best method to test your materials.
|The photos to the top and left of this block show our S band cavity for Material testing. Our cavities have quality factors, (Q) of over 5000 typically.|
|The photograph to the left shows a typical S21 arch style measurement for testing large dielectric sheets and samples typically used in radomes and other resonant dielectrics. The test setup shown is used at 10 GHz.|
The photos above show a coaxial fixture with capacitive coupling that we use to measure dielectric properties in an S21 environment.
|The photos to the left, shows a WR284 slotted waveguide fixture used to measure S21 loss of materials from which we can calculated dielectric properties or provide plotted insertion loss per length.|